SINO AGE DEVELOPMENT TECHNOLOGY, LTD.
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Piezoelectric probe 3 digital LCD Portable metal Surface Roughness Tester with 7 type of probes for option
Pocket Surface roughness tester RoughScan
RoughScan of pocket Surface roughness tester is a portable, batterypowered instrument for checking surface roughness with the measured values displayed on a digital readout. The instrument can be used in the laboratory, an inspection area, in the shop, or wherever on-site surface roughness testing is required.
Specifications
| Model | SADT RoughScan |
| Measuring Range | Ra: 0.03μm~6.3μm/1μ”~250μ” Rz/Ry/Rmax: 0.2μm~25μm/8μ”~999μ” |
| Resolution | 0.01μm/1μ” |
| Cut-off | 0.8mm/0.30”, ANSI 2RC Filter |
| Display | 3-digit LCD |
| Readout Error | ±10% |
| Stability | ≤6% |
| Sensor Type | Piezoelectric |
| Maximum stylus force | 15.0mN/1500mgf |
| Working Environment | 10oC~45oC |
| Storage Temperature | 0oC~60oC |
| Traverse length | Evaluation length | Numbers of cutoff |
| 0.5mm | 0.25mm | 1 |
| 1.2mm | 0.8mm | |
| 5.5mm | 5.0mm | |
| 1.25mm | 0.75mm | 2 |
| 3.0mm | 2.4mm | |
| 5.5mm | 5.0mm | |
| 1.75mm | 1.25mm | 3 |
| 4.5mm | 4.0mm | |
| 5.5mm | 5.0mm |
| Probe | Application |
| Generalpurpose probe SFP-2001 / SFP-2002 | For most surface roughness applications. SFP-2001 has a 90° conical diamond stylus. 0004”/10μm radiusper ISOstandards. SFP-2002 has a 90° conical diamond stylus. 0002”/ 5μm radius per DIN standards. |
| Transversechisel probe SFP-2003 | For gaging sharp edges or small O. D.’s where probe is aligned with (in 180° or closed position) to axis of traverse. 90° diamond chisel stylus, .0004”/ 10μm radius. |
| Parall elchisel probe SFP-2004 | For gaging sharp edges or small O. D.’s where probe is perpendicular (in 90° or 270° position) to axis of traverse. 90° diamond chisel stylus. 0004”/ 10μm radius. |
| Small bore probe SFP-2005 / SFP-2006 | For measurings mall bores (min. inside diameter of 5 . 0 mm , up to a depth of 15.0mm). 90° conical diamond stylus, .0004”/ 10μm radius for SFP-2005; 9 0° conical diamond stylus. 0002”/ 5μm radius for SFP-2006 |
| Groove bottom probe | For measuring the bottoms of “ O ” ring grooves , recesses and holes to depth of 6.0mm. Also used for short lands and shoulders. 90° conical diamond stylus, 0004”/10μm radius. |
Standard package - RoughScan
RoughScan main unit 1
Standard probe 1
Calibrate plate with the refer[1]ence specimen 1
9-volt alkaline battery 1
Screw driver 1
Operation manual 1
Carrying case 1
Optional accessories
General Purpose Probe SFP-2001
General Purpose Probe SFP-2002
Transverse Chisel Probe SFP-2003
Parallel Chisel Probe SFP-2004
Small Bore Probe SFP-2005
Small Bore Probe SFP-2006
Groove bottom probe SFP-2007
Height Stand
Standard test block
