SINO AGE DEVELOPMENT TECHNOLOGY, LTD.
Sino Age Development Technology Our products are your best choice in NDT and quality control field All products supplied by SADT have excellent quality and competitive price with our best service.
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HARTIP 3000+ is a new generation of Leeb hardness tester with more advanced technology and features. The tester applies our new patent sensor technology which makes the tester more accurate than old previous model. All impact devices (probes) do not need to set up impact direction. HARTIP 3000+ works with digital impact device. The measuring values can be downloaded to PC and printer by wireless or by cable. The HARTIP 3000+ also can be powered by USB power supply without battery via PC cable.
Specifications:
| HARTIP3000+ | |||
| Principle | Leeb Hardness Measurement | Memory | 31 Files, 100 Data For Each File, Can Be Saved And Re-Readable |
| Accuracy | ±0.3% @ HL=800, Repeatability: ±2HL | Statistics | Various Statistical Analysis |
| Display | 2.8” 320 X 240 TFT Color LCD - Fittable Under Sunshine | Re-Calibration | Allowed By User |
|
Hardness Scale | HL / HRC / HRB / HB / HV / HS / HRA / MPa |
Indicator | Upper Limit / Lower Limit / Low Battery / Buzzer Warning / Date And Time |
|
Measuring Range | HL100-960 / HRC0.9-79.2 / HRB1.0-140 / HB1-1878 / HV1-1698 / HS0.5-1370 / HRA1.0-88.5 / MPa(Rm)1-6599N/Mm2 |
Display Resolution |
1HL, 0.1HRC |
| Digital Probe | DC / D+15 / C / G / E / DL (Optional) | Communication Interface | USB / RS232 Bluetooth (Optional) |
| Impact Direction | Universal Angle Type | Continous Working Time | >40 Hours |
| Materials And Conversion Curves | 12 Common Metal Materials, 75 Conver- Sion Curves |
Power Supply | 1.5V AA Alkaline Battery X 4 / 1.2V Nickel-Hydrogen Rechargerable Bat- Tery X 4 / USB Power Supply |
| Working Environment | -10ºC~+45ºC | Dimension (Mm) | 195 X 84 X 38 |
| Net Weight (G) | 550 | Standards | ASTM A956, DIN 50156, EN ISO 16859, GB/T 17394-1998 |
Portable Hardness Tester
●Standard package HARTIP 3000+ main unit 1
●Digital probe D 1
●Small support ring 1
●Test block D 1 Cleaning brush 1
●USB cable 1
●PC software 1
●Operation manual 1
●Test Certificate 1
●Carrying case 1
| Type | Brief description | |
| D | Universal standard unit for majority of hardness testing assignments. | |
| DC | Extremely short impact device, other specs identical with type D. | |
| Application: | - highly confined spaces | |
| - holes and cylinders | ||
| - internal measurements on assembled machines | ||
| D+15 | Slim front section | |
| Application: | - grooves and recessed surfaces. | |
| DL | Extremely slim front section | |
| Application: | - extremely confined spaces | |
| - base of grooves | ||
| C | Reduced impact energy ( compared with type D). | |
| Application: | - surface hardened components, coatings | |
| - minimum layer thickness: 0.2mm. | ||
| - thin walled or impact sensitive components (small measuring indentation). | ||
| E | Synthetic diamond test tip (approx.5000 HV). | |
| Application: | - extremely high hardness measurement such as high carbon steel up to 1200 HV | |
| G | Increased impact energy(approx. 9 times that of type D) | |
| Application: | - Brinell hardness range only | |
| - heavy cast and forged parts with lower demands on surface finish. | ||