SINO AGE DEVELOPMENT TECHNOLOGY, LTD.

Sino Age Development Technology Our products are your best choice in NDT and quality control field All products supplied by SADT have excellent quality and competitive price with our best service.

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Iso9001 Portable Ultrasonic Probe For Flaw Detector

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SINO AGE DEVELOPMENT TECHNOLOGY, LTD.
City:beijing
Province/State:beijing
Country/Region:china
Contact Person:MsHu
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Iso9001 Portable Ultrasonic Probe For Flaw Detector

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Brand Name :SADT
Certification :ISO9001
Place of Origin :China
MOQ :1pcs
Payment Terms :T/T, Western Union, paypal
Delivery Time :5-8 working days
Application :industrial metal flaw test
industrial metal flaw test :Flaw detection
Measurement mode :Single,Thru
Warranty :1 year
Probe type :angle probe, straight probe
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angle probe (single) straight probe (single) angle probe (dual) straight probe (dual)

Industrial Metal Flaw Test Ultrasonic Probe High Precision SGS Certification

Ultrasonic Probe

All probes are manufactured & tested according to relevant international standards. Apply on regular geometry & smooth surface; Requires couplant between medium; Design to meet inspection criteria throughout the international standards.

Ultrasonic probe for flaw detector


Angle probe (Single)
Straight probe (Single)
Angle probe (Dual)
Straight probe (Dual)
Probe cable

Specifications

Item Description Itme Description
Angle Probe (Single) 5MHz, 6x6mm, 45 DEGREE Straight Probe
(Single)
2MHz, 12mm, 0 DEGREE
5MHz, 6x6mm, 60 DEGREE 4MHz, 12 Mm, 0 DEGREE
5MHz, 6x6mm, 70 DEGREE 2MHz, 20mm, 0 DEGREE
2MHz, 8X9mm, 45 DEGREE 4MHz, 20 Mm, 0 DEGREE
2MHz, 8X9mm, 60 DEGREE 0.5MHz, 24mm, 0 DEGREE
2MHz, 8X9mm, 70 DEGREE 1MHz, 24 Mm, 0 DEGREE
4MHz, 8X9mm, 45 DEGREE 2MHz, 24mm, 0 DEGREE
4MHz, 8X9mm, 60 DEGREE 4MHz, 24 Mm, 0 DEGREE
4MHz, 8X9mm, 70 DEGREE Straight Probe
(Dual)
2MHz, 12 Mm, 0 DEGREE DUAL
2MHz, 14X16mm, 45 DEGREE 2MHz, 12 Mm, 0 DEGREE DUAL
2MHz, 14X16mm, 60 DEGREE 2MHz, 20 Mm, 0 DEGREE DUAL
2MHz, 14X16mm, 70 DEGREE 4MHz, 20 Mm, 0 DEGREE DUAL
4MHz, 14X16mm, 45 DEGREE 2MHz, 24 Mm, 0 DEGREE DUAL
4MHz, 14X16mm, 60 DEGREE 4MHz, 24 Mm, 0 DEGREE DUAL
4MHz, 14X16mm, 70 DEGREE Probe Cable Q9-Q9
2MHz, 20X22mm, 45 DEGREE Q9-C5
2MHz, 20X22mm, 60 DEGREE C9-Q9
2MHz, 20X22mm, 70 DEGREE C9-C5
4MHz, 20X22mm, 45 DEGREE Q9-Microdot
4MHz, 20X22mm, 60 DEGREE Q9-C5(Daul)
4MHz, 20X22mm, 70 DEGREE Q9-Microdot(Daul)
Angle Probe (Dual) 4MHz, 3x10mm, 45 DEG, FD=10mm
4MHz, 3x10mm, 60 DEG, FD=8mm
4MHz,3x10mm, 70DEG, FD=6mm

Ultrasonic Probe For Flaw Detector

Angle probe (Single)

Straight probe (Single)

Angle probe (Dual)

Straight probe (Dual)

Probe cable

Sino Age Development Technology, Ltd. (SADT), established in 1993, is a leading manufacturer for measuring and testing instrument, specialized in NDT and quality control fields. We have our own HARTIP series portable hardness testers since 1995. We are professional producer with ISO 9001 quality system. Most of the products are applied with CE certificate.

Now our main products cover hardness tester, ultrasonic thickness gauge, concrete test hammer, gloss meter, colorimeter, roughness tester, metallurgical microscope, ultrasonic flaw detector and so on. We have exported our products in batch quantity to overseas market since 1996. Our main overseas markets are: USA, Canada, Germany, France, Netherlands, Finland, Italy, Czech Republic, Poland, Lithuania, Estonia, Serbia, Russia, Greece, Turkey, Australia, New Zealand, Korea, Taiwan, Singapore, Thailand, Indonesia, Malaysia, Vietnam, India, Pakistan, Iran, UAE, Egypt, South Africa, Mexico and Columbia, Peru and etc. All products supplied by SADT have excellent quality and competitive price with our best service.

Iso9001 Portable Ultrasonic Probe For Flaw DetectorIso9001 Portable Ultrasonic Probe For Flaw Detector

Iso9001 Portable Ultrasonic Probe For Flaw Detector

Iso9001 Portable Ultrasonic Probe For Flaw DetectorIso9001 Portable Ultrasonic Probe For Flaw DetectorIso9001 Portable Ultrasonic Probe For Flaw DetectorIso9001 Portable Ultrasonic Probe For Flaw DetectorIso9001 Portable Ultrasonic Probe For Flaw Detector

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